Lixing Zhou
0000-0002-4955-8705
3 papers found
Refreshing results…
Understanding the mechanisms impacting the interface states of ozone-treated high-k/SiGe interfaces
Experimental Investigation of Remote Coulomb Scattering on Mobility Degradation of Ge pMOSFET by Various PDA Ambiences
Identification of interfacial defects in a Ge gate stack based on ozone passivation
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