Xiangdong Li
0000-0002-6694-0914
KU Leuven
5 papers found
Refreshing results…
Comparative Investigation on the Repetitive Short-Circuit Capability of 100 V Commercial p-GaN Gate Power HEMTs With Different Processing and Structure
Experimental Study and Characterization on the Thermo-Electro Multiphysics Coupling Failure of GaN HEMTs Under High-Power Microwave Pulse
Reliability of p-GaN Gate HEMTs in Reverse Conduction
Modeling of the Vertical Leakage Current in AlN/Si Heterojunctions for GaN Power Applications
Impact of Substrate Resistivity on the Vertical Leakage, Breakdown, and Trapping in GaN-on-Si E-Mode HEMTs
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