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Comparison of Single-Event Transients in SiGe HBTs on Bulk and Thick-Film SOI
Download from ieeexplore.ieee.orgNew Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles
UploadUsing Bessel beams and two-photon absorption to predict radiation effects in microelectronics
Download from doi.orgUsing TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs
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