Teimuraz Mchedlidze

All papers authored by Teimuraz Mchedlidze

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2019 Teimuraz Mchedlidze

, Joerg Weber

Location and Properties of Carrier Traps in mc‐Si Solar Cells Subjected to Degradation at Elevated Temperatures

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Teimuraz Mchedlidze

, Md Mahabubul Alam, Axel Herguth, Joerg Weber

In Situ Observation of the Degradation in Multi‐Crystalline Si Solar Cells by Electroluminescence

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2017 E. V. Lavrov, I. Chaplygin, T. Mchedlidze

Photoconductivity as a method to probe defects in ultra thin Si films

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2014 Teimuraz Mchedlidze

, Christian Möller

, Kevin Lauer

, Jörg Weber

Evolution of iron-containing defects during processing of Si solar cells

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Teimuraz Mchedlidze

, Jörg Weber

Radial distribution of iron in silicon crystals grown by Czochralski method from contaminated feedstock

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T. Mchedlidze

, M. Nacke, E. Hieckmann, J. Weber

On the capability of deep level transient spectroscopy for characterizing multi-crystalline silicon

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2013 Martin Schade, Teimuraz Mchedlidze

, Martin Kittler, Hartmut S. Leipner

Light induced crystallization of an amorphous silicon film embedded between silicon oxide layers

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This paper is made freely available by the publisher.

Kevin Lauer, Christian Möller, Kristin Neckermann, Michael Blech, Martin Herms, Teimuraz Mchedlidze

, Jörg Weber, Sylke Meyer

Impact of a p-type Solar Cell Process on the Electrical Quality of Czochralski Silicon

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T. Mchedlidze

, L. Scheffler, J. Weber, M. Herms, J. Neusel, V. Osinniy, C. Möller, K. Lauer

Local detection of deep carrier traps in the pn-junction of silicon solar cells

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2012 Dawid Kot, Teimuraz Mchedlidze

, Gudrun Kissinger, Wilfried Von Ammon

Characterization of Deep Levels Introduced by RTA and by Subsequent Anneals in n-Type Silicon

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T. Mchedlidze

, W. Seifert, M. Kittler, A. T. Blumenau, B. Birkmann, T. Mono, M. Müller

Capability of photoluminescence for characterization of multi-crystalline silicon

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T. Mchedlidze

, M. Kittler

Investigation of defect states in heavily dislocated thin silicon films

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2011 Teimuraz Mchedlidze

, J. Hendrik Zollondz, Martin Kittler

Characterization of Traps in Crystalline Silicon on Glass Film Using Deep-Level Transient Spectroscopy

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Teimuraz Mchedlidze

, Tzanimir Arguirov, Martin Kittler

Fast Light-Induced Solid Phase Crystallization of Nanometer Thick Silicon Layers on Quartz

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M. Trushin, O. Vyvenko, T. Mchedlidze

, M. Reiche, M. Kittler

Electrical characterization of silicon wafer bonding interfaces by means of voltage dependent light beam and electron beam induced current and capacitance of Schottky diodes

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R. P. Schmid, D. Mankovics, T. Arguirov, T. Mchedlidze

, M. Kittler

Novel imaging techniques for dislocation-related D1-photo-luminescence of multicrystalline Si wafers - two different approaches

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M. Ratzke, T. Mchedlidze

, T. Arguirov, N. Acharya, M. Kittler, J. Reif

Scanning probe studies of amorphous silicon subjected to laser annealing

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Teimuraz Mchedlidze

, Jens Schneider, Tzanimir Arguirov, Martin Kittler

Characterization of crystalline silicon on glass using photoluminescence

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Tzanimir Arguirov, Christian Wenger, Mindaugas Lukosius, Teimuraz Mchedlidze

, Manfred Reiche, Martin Kittler

Silicon based light emitter utilizing tunnel injection of excess carriers via MIS structure

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Teimuraz Mchedlidze

, Tzanimir Arguirov, Oleg Kononchuk, Maxim Trushin, Martin Kittler

Structures responsible for radiative and non-radiative recombination activity of dislocations in silicon

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All papers authored by Teimuraz Mchedlidze