Wenwu - Dissemin

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All papers authored by Wenwu

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Jiahui Duan

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, Hao Xu, Shujing Zhao, Fengbin Tian, Jinjuan Xiang, Kai Han, Tingting Li, Xiaolei Wang

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, Wenwu Wang, Tianchun Ye

ORCID

Impact of mobility degradation on endurance fatigue of FeFET with TiN/Hf_0.5Zr_0.5O₂/SiO_x/Si (MFIS) gate structure

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