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Single-Event Transients in SiGe HBTs Induced by Pulsed X-Ray Microbeam
Download from ieeexplore.ieee.orgUtilizing SiGe HBT Power Detectors for Sensing Single-Event Transients in RF Circuits
Download from ieeexplore.ieee.orgSiGe HBT Profiles With Enhanced Inverse-Mode Operation and Their Impact on Single-Event Transients
UploadUsing TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs
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