Maria Katsikini
Aristotle University of Thessaloniki
94 papers found
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Microstructural characterization of InxGa1-xN MBE samples
Download from www.researchgate.netRaman study of Mg, Si, O, and N implanted GaN
UploadXAFS characterization of buried SixNyOz samples
Download from www.researchgate.netA parametric study of implantation-induced variations on the mechanical properties of epitaxial GaN
Download from www.researchgate.netIon implantation effects on the microhardness and microstructure of GaN
Download from www.researchgate.netStudy of group-III binary and ternary nitrides using X-ray absorption fine structure measurements
Download from www.researchgate.netNitrogen K-edge NEXAFS measurements on group-III binary and ternary nitrides
Download from www.researchgate.netNitrogenK-edge EXAFS measurements on Mg- and Si-doped GaN
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