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Interpreting anomalies observed in oxide semiconductor TFTs under negative and positive bias stress
Download from doi.orgValidating silicon polytrodes with paired juxtacellular recordings: method and dataset
Download from www.ncbi.nlm.nih.govA Second-Order ΣΔ ADC Using Sputtered IGZO TFTs
UploadThe 2016 oxide electronic materials and oxide interfaces roadmap
Download from stacks.iop.orgElectrodeposition of WO3 Nanoparticles for Sensing Applications
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