Zongyang Hu
0000-0001-7854-8875
3 papers found
Refreshing results…
Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction
Trapping and Detrapping Mechanisms in β-Ga₂O₃ Vertical FinFETs Investigated by Electro-Optical Measurements
Breakdown Walkout in Polarization-Doped Vertical GaN Diodes
Missing publications? Search for publications with a matching author name.