Aman Haque
0000-0001-6535-5484
5 papers found
Refreshing results…
Temperature-induced degradation of GaN HEMT: An in situ heating study
Low temperature recovery of OFF-state stress induced degradation of AlGaN/GaN high electron mobility transistors
Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy
Transformation of 2D Group-III selenides to ultra-thin nitrides: enabling epitaxy on amorphous substrates
Large scale 2D/3D hybrids based on gallium nitride and transition metal dichalcogenides
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