Gaudenzio Meneghesso
0000-0002-6715-4827
328 papers found
Refreshing results…
Study of the effect of stress-induced trap levels on OLED characteristics by numerical model
Time- and Field-Dependent Trapping in GaN-Based Enhancement-Mode Transistors With p-Gate
Random telegraph signal noise in gate current of unstressed and reverse-bias-stressed AlGaN/GaN high electron mobility transistors
Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells
Analysis of the deep level responsible for the degradation of InGaN-based laser diodes by DLTS
Effect of Shunt Resistance on the Performance of mc-Silicon Solar Cells: A Combined Electro-Optical and Thermal Investigation
Effects of Channel Hot Carrier Stress on III-V Bulk Planar MOSFETs
Improved Tolerance against UV and Alpha Irradiation of Encapsulated Organic TFTs
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
Hot electrons and time-to-breakdown induced degradation in AlGaN/GaN HEMTs
Organic Thin Film Transistor Degradation Under Sunlight Exposure
Innovative methodology for testing the reliability of LED based systems
Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias
Experimental and Numerical Correlation between Current-Collapse and Fe-doping Profiles in GaN HEMTs
Degradation of AlGaN/GaN high electron mobility transistors related to hot electrons
GaN HEMT Reliability: From Time Dependent Gate Degradation to On-state Failure Mechanisms
Double-Halo Field-Effect Transistor—A Multifunction Device to Sustain the Speed and Density Rate of Modern Integrated Circuits
Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: A complete model
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures
Near-UV Irradiation Effects on Pentacene-Based Organic Thin Film Transistors
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