All papers authored by Stephan Menzel
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2024
Faisal Munir 
,
Daniel Schön ,
Stephan Menzel ,
Pascal Stasner ,
Rainer Waser ,
Stefan Wiefels
,
Daniel Schön ,
Stephan Menzel ,
Pascal Stasner ,
Rainer Waser ,
Stefan Wiefels
Evaluation Methods for ReRAM Potentiation on Sub-Nanosecond Timescales
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Stephan Aussen ,
Felix Cüppers ,
Carsten Funck,
Janghyun Jo ,
Stephan Werner ,
Christoph Pratsch ,
Stephan Menzel ,
Regina Dittmann ,
Rafal Dunin‐Borkowski ,
Rainer Waser ,
Susanne Hoffmann‐Eifert
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,
Felix Cüppers ,
Carsten Funck,
Janghyun Jo ,
Stephan Werner ,
Christoph Pratsch ,
Stephan Menzel ,
Regina Dittmann ,
Rafal Dunin‐Borkowski ,
Rainer Waser ,
Susanne Hoffmann‐Eifert
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Daniel Schön ,
Stephan Menzel
,
Stephan Menzel
Spatio‐Temporal Correlations in Memristive Crossbar Arrays due to Thermal Effects
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2022
Florian Freye ,
Jie Lou ,
Christopher Bengel ,
Stephan Menzel ,
Stefan Wiefels ,
Tobias Gemmeke
,
Jie Lou ,
Christopher Bengel ,
Stephan Menzel ,
Stefan Wiefels ,
Tobias Gemmeke
Memristive Devices for Time Domain Compute-in-Memory
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K. Schnieders ,
C. Funck,
F. Cüppers ,
S. Aussen ,
T. Kempen ,
A. Sarantopoulos ,
R. Dittmann ,
S. Menzel ,
V. Rana ,
S. Hoffmann-Eifert ,
S. Wiefels
,
C. Funck,
F. Cüppers ,
S. Aussen ,
T. Kempen ,
A. Sarantopoulos ,
R. Dittmann ,
S. Menzel ,
V. Rana ,
S. Hoffmann-Eifert ,
S. Wiefels
Effect of electron conduction on the read noise characteristics in ReRAM devices
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Christopher Bengel ,
Johannes Mohr ,
Stefan Wiefels ,
Abhairaj Singh ,
Anteneh Gebregiorgis ,
Rajendra Bishnoi ,
Said Hamdioui ,
Rainer Waser ,
Dirk Wouters,
Stephan Menzel
,
Johannes Mohr ,
Stefan Wiefels ,
Abhairaj Singh ,
Anteneh Gebregiorgis ,
Rajendra Bishnoi ,
Said Hamdioui ,
Rainer Waser ,
Dirk Wouters,
Stephan Menzel
Reliability aspects of binary vector-matrix-multiplications using ReRAM devices
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Nils Kopperberg ,
Stefan Wiefels ,
Karl Hofmann,
Jan Otterstedt,
Dirk J. Wouters ,
Rainer Waser ,
Stephan Menzel
,
Stefan Wiefels ,
Karl Hofmann,
Jan Otterstedt,
Dirk J. Wouters ,
Rainer Waser ,
Stephan Menzel
Endurance of 2 Mbit Based BEOL Integrated ReRAM
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Mario Lanza ,
Rainer Waser,
Daniele Ielmini,
J. Joshua Yang,
Ludovic Goux,
Jordi Suñe,
Anthony Joseph Kenyon,
Adnan Mehonic,
Sabina Spiga ,
Vikas Rana,
Stefan Wiefels ,
Stephan Menzel ,
Ilia Valov ,
Marco A. Villena,
Enrique Miranda
and 21 other authors
,
Rainer Waser,
Daniele Ielmini,
J. Joshua Yang,
Ludovic Goux,
Jordi Suñe,
Anthony Joseph Kenyon,
Adnan Mehonic,
Sabina Spiga ,
Vikas Rana,
Stefan Wiefels ,
Stephan Menzel ,
Ilia Valov ,
Marco A. Villena,
Enrique Miranda
and 21 other authors
Standards for the Characterization of Endurance in Resistive Switching Devices
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2020
Sebastian Siegel ,
Christoph Baeumer ,
Alexander Gutsche ,
Moritz Witzleben ,
Rainer Waser ,
Stephan Menzel ,
Regina Dittmann
,
Christoph Baeumer ,
Alexander Gutsche ,
Moritz Witzleben ,
Rainer Waser ,
Stephan Menzel ,
Regina Dittmann
Trade‐Off Between Data Retention and Switching Speed in Resistive Switching ReRAM Devices
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