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Standards for the Characterization of Endurance in Resistive Switching Devices
UploadDesign of defect-chemical properties and device performance in memristive systems
Download from doi.orgNanoscale cation motion in TaOx, HfOx and TiOx memristive systems
Download from www.nature.comUnderstanding the conductive channel evolution in Na:WO3−x-based planar devices
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