Jon M. Molina-Aldareguia

Papers authored by Jon M. Molina-Aldareguia

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2006 F. Iacopi, Y. Travaly, M. Van Hove, A. M. Jonas, J. M. Molina-Aldareguia

, M. R. Elizalde, I. Ocaña

Extent of plasma damage to porous organosilicate films characterized with nanoindentation, x-ray reflectivity, and surface acoustic waves

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G. Xu, I. Ocana, J. M. Molina Aldareguia

, J. Molinaaldareguia, D. Gonzalez, M. R. Elizalde, J. M. Martinez Esnaola, J. M. Sanchez, J. Gil Sevillano

, J. Martinezesnaola, J. Gilsevillano, T. Scherban, B. Miner, D. Pantuso, J. He and 2 other authors

Fracture characterization in patterned thin films by cross-sectional nanoindentation

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Hans Söderberg, Magnus Odén, Tommy Larsson, Lars Hultman, Jon M. Molina-Aldareguia

Epitaxial stabilization of cubic-SiNx in TiN∕SiNx multilayers

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I. Ocaña, J. M. Sánchez, J. M. Sanchez, T. Scherban, D. Pantuso, B. Sun, G. Xu, D. Gonzalez, M. R. Elizalde, J. M. Martínez Esnaola, J. M. Molina Aldareguia

, J. Gil Sevillano

, J. He, B. Miner, J. Maiz

Adhesion Studies in Low-k Interconnects Using Cross Sectional Nanoindentation

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This paper was not found in any repository; the policy of its publisher is unknown or unclear.

W. J. Clegg, F. Giuliani, Y. Long, S. J. Lloyd, J. M. Molina-Aldareguia

, I. M. Low

Hardness of multilayered ceramics

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Y. Long, F. Giuliani, S. J. Lloyd, J. Molina Aldareguia

, Z. H. Barber, W. J. Clegg

Deformation processes and the effects of microstructure in multilayered ceramics

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2005 H. Högberg, L. Hultman, J. Emmerlich, T. Joelsson, P. Eklund, J. M. Molina Aldareguia

, J.-P. Palmquist, O. Wilhelmsson, U. Jansson

Growth and Characterization of MAX-Phase Thin Films

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T. Joelsson, L. Hultman, H. W. Hugosson, J. M. Molina Aldareguia

Phase stability tuning in the NbxZr1−xN thin-film system for large stacking fault density and enhanced mechanical strength

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This paper is made freely available by the publisher.

S. J. Lloyd, J. M. Molina-Aldareguia

, W. J. Clegg

Structural characterization of TiN/NbN multilayers: X-ray diffraction, energy-filtered TEM and Fresnel contrast techniques compared

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Hans Söderberg, Magnus Oden, Jon M. Molina-Aldareguia

, Lars Hultman

Nanostructure formation during deposition of TiN/SiNx nanomultilayer films by reactive dual magnetron sputtering

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Clegg Wj, S. J. Lloyd, Lloyd Sj, A. Castellero, F. Giuliani, Y. Long, McLaughlin Kk, K. K. McLaughlin, Molina-Aldareguia Jm, J. M. Molina-Aldareguia

, Stelmashenko Na, N. A. Stelmashenko, Vandeperre Lj, L. J. Vandeperre, W. J. Clegg

Observations of nanoindents via cross-sectional transmission electron microscopy: a survey of deformation mechanisms

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2004 Jens Emmerlich, Hans Högberg, Hans Högberg, Per O. Å. Persson, Szilvia Z. Sasvári, Per O. Å. Persson, Lars Hultman, Jens-Petter Palmquist, Jon M. Molina Aldareguia

, Ulf Jansson, Zsolt S. Czigány

Growth of Ti3SiC2 Thin Films by Elemental Target Magnetron Sputtering

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Sj Lloyd, Jm Molina-Aldareguia

, S. McVitie, D. McComb

Composition profiles from TiN/NbN multilayers: elastic and inelastic electron scattering techniques compared

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2003 Stephen J. Lloyd, Jon M. Molina Aldareguia

Multilayered materials: A palette for the materials artist

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J. P. Palmquist, J. Emmerlich, U. Jansson, J. M. Molina Aldareguia

, L. Hultman

Kink Formation Around Indents in Laminated Ti3SiC2 Thin Films Studied in the Nanoscale

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2002 Jm M. Molina-Aldareguia

, Sj J. Lloyd, M. Odén, T. Joelsson, L. Hultman, Wj J. Clegg

Deformation structures under indentations in TiN/NbN single-crystal multilayers deposited by magnetron sputtering at different bombarding ion energies

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Sj J. Lloyd, Jm M. Molina-Aldareguia

, Wj J. Clegg

Deformation under nanoindents in sapphire, spinel and magnesia examined using transmission electron microscopy

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P. O. Å. Persson, P. O. Å. Persson, L. Hultman, H. Jacobson, J. P. Bergman, E. Janzén, J. M. Molina Aldareguia

, W. J. Clegg, T. Tuomi

Structural defects in electrically degraded 4H-SiC p+/n−/n+ diodes

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P. O. Å. Persson, P. O. A. Persson, J. M. Molina Aldareguia

, Henrik Jacobsson, H. Jacobson, J. Peder Bergman, J. Peder Bergman, T. O. Tuomi, W. J. Clegg, L. Hultman, Erik Janzén

Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

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2001 S. J. Lloyd, J. M. Molina-Aldareguia

, W. J. Clegg

Deformation under nanoindents in Si, Ge, and GaAs examined through transmission electron microscopy

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Papers authored by Jon M. Molina-Aldareguia