Mitsuru Takenaka
0000-0002-9852-1474
3 papers found
Refreshing results…
Improved Ferroelectric/Semiconductor Interface Properties in Hf0.5Zr0.5O2 Ferroelectric FETs by Low-Temperature Annealing
Effects of ZrO2/Al2O3 Gate-Stack on the Performance of Planar-Type InGaAs TFET
Group IV mid-infrared photonics [Invited]
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