Fabrizio Roccaforte
0000-0001-8632-0870
3 papers found
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Genesis and evolution of extended defects: The role of evolving interface instabilities in cubic SiC
Ni/4H-SiC interaction and silicide formation under excimer laser annealing for ohmic contact
3C-SiС Hetero-Epitaxially Grown on Silicon Compliance Substrates and New 3C-SiС Substrates for Sustainable Wide-Band-Gap Power Devices (CHALLENGE)
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