Jörg Schneider
0000-0002-8153-9491
3 papers found
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Zinc Oxide Defect Microstructure and Surface Chemistry Derived from Oxidation of Metallic Zinc: Thin‐Film Transistor and Sensor Behavior of ZnO Films and Rods
Metal oxide double layer capacitors by electrophoretic deposition of metal oxides. Fabrication, electrical characterization and defect analysis using positron annihilation spectroscopy
Structural Polymorphism and Thin Film Transistor Behavior in the Fullerene Framework Molecule 5,6;11,12-di-o -Phenylenetetracene
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