Carol Trager-Cowan
0000-0001-8684-7410
5 papers found
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Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction
Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy
Kikuchi pattern simulations of backscattered and transmitted electrons
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Luminescence behavior of semipolar ( 10 1 ¯ 1 ) InGaN/GaN “bow-tie” structures on patterned Si substrates
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