Peter Khalifah
0000-0002-2216-0377
3 papers found
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Enumeration as a tool for structure solution – a materials genomic approach to solving the cation-ordered structure of Na3V2(PO4)2F3
Synchrotron Operando Depth Profiling Studies of State-of-Charge Gradients in Thick Li(Ni0.8Mn0.1Co0.1)O2 Cathode Films
Extending the limits of powder diffraction analysis: Diffraction parameter space, occupancy defects, and atomic form factors
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