Dennis Ball
0000-0003-0411-1835
5 papers found
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Inclusion of Radiation Environment Variability for Reliability Estimates for SiC Power MOSFETs
Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes
Single-Event Burnout Mechanisms in SiC Power MOSFETs
The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-Flops
Exploiting Parallelism and Heterogeneity in a Radiation Effects Test Vehicle for Efficient Single-Event Characterization of Nanoscale Circuits
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