Matthew Charles
www.mendeley.com
0000-0003-0668-8865
CEA-Leti
3 papers found
Refreshing results…
Study of GaN coalescence by dark-field X-ray microscopy at the nanoscale
Unravelling the unwanted Ga incorporation effect on InGaN epilayers grown in CCS MOVPE reactors
The 2018 GaN power electronics roadmap
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