All papers authored by Francesco La Via
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Lucia Calcagno,
Caterina Ciampi ,
Francesco La Via ,
Gaetano Lanzalone,
Annamaria Muoio ,
Gabriele Pasquali ,
Domenico Pellegrino,
Sebastiana Puglia,
Giuseppe Rapisarda ,
Salvatore Tudisco
Radiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors
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Daniel Alquier ,
Filippo Giannazzo ,
Tsunenobu Kimoto,
Philip Neudeck,
Haiyan Ou ,
Alberto Roncaglia ,
Stephen E. Saddow ,
Salvatore Tudisco
Emerging SiC Applications beyond Power Electronic Devices
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Massimo Zimbone ,
Corrado Bongiorno ,
Antonino La Magna ,
Giuseppe Fisicaro ,
Ioannis Deretzis ,
Viviana Scuderi,
Cristiano Calabretta,
Filippo Giannazzo ,
Marcin Zielinski ,
Ruggero Anzalone,
Marco Mauceri,
Danilo Crippa,
Emilio Scalise ,
Anna Marzegalli
and 9 other authors
New Approaches and Understandings in the Growth of Cubic Silicon Carbide
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Marica Rebai,
Marco Tardocchi,
Carmen Altana,
Carlo Cazzaniga,
Eliana De Marchi,
Francesco La Via ,
Laura Meda ,
Alessandro Meli,
Miriam Parisi,
Enrico Perelli Cippo,
Mario Pillon ,
Antonio Trotta,
Salvo Tudisco ,
Giuseppe Gorini
Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors
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José Roberto Brandão de Oliveira,
Luis Acosta ,
Clementina Agodi ,
Carmen Altana,
Paulina Amador-Valenzuela,
Prof. Dr. Ismail Boztosun ,
Sandro Brasolin,
Giuseppe A. Brischetto,
Oscar Brunasso,
Salvatore Calabrese,
Luciano Calabretta,
Daniela Calvo,
Vittoria Capirossi,
Francesco Cappuzzello
and 34 other authors
The NUMEN Heavy Ion Multidetector for a Complementary Approach to the Neutrinoless Double Beta Decay
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Marcin Zielinski ,
Corrado Bongiorno,
Cristiano Calabretta,
Ruggero Anzalone,
Silvia Scalese ,
Giuseppe Fisicaro ,
Antonino La Magna,
Fulvio Mancarella,
Francesco La Via
3C-SiC Growth on Inverted Silicon Pyramids Patterned Substrate
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Cristiano Calabretta,
Marco Mauceri,
Alessandra Alberti,
Riccardo Reitano ,
Francesco La Via
Temperature Investigation on 3C-SiC Homo-Epitaxy on Four-Inch Wafers
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Francesco La Via ,
Clementina Agodi ,
Carmen Altana,
Giacomo Borghi,
Maurizio Boscardin,
Giancarlo Bussolino,
Lucia Calcagno,
Massimo Camarda,
Francesco Cappuzzello ,
Diana Carbone ,
Salvatore Cascino,
Giovanni Casini,
Manuela Cavallaro ,
Caterina Ciampi
and 29 other authors
SiCILIA—Silicon Carbide Detectors for Intense Luminosity Investigations and Applications
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Anna Marzegalli,
Roberto Bergamaschini ,
Marco Mauceri,
Danilo Crippa,
Francesco La Via ,
Hans von Känel,
Leo Miglio
Solving the critical thermal bowing in 3C-SiC/Si(111) by a tilting Si pillar architecture
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S. Baldo,
G. Fisicaro,
R. Anzalone,
S. Scalese,
A. Alberti,
F. La Via ,
A. La Magna,
A. Ballo,
G. Giustolisi,
L. Minafra,
F. P. Cammarata,
V. Bravatà,
G. I. Forte,
G. Russo
and 1 other authors
Download from www.researchgate.net
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F. La Via
A novel micro-Raman technique to detect and characterize 4H-SiC stacking faults
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Thomas Kreiliger,
Alfonso Gonzalez Taboada,
Mojmir Meduna,
Rolf Kaufmann,
Antonia Neels,
Alex Dommann,
Philippe Niedermann,
Fulvio Mancarella
and 9 other authors
Download from iopscience.iop.org
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M. Cutroneo,
L. Torrisi,
F. La Via ,
J. Ullschmied
MeV ion beams generated by intense pulsed laser monitored by Silicon Carbide detectors
Download from dx.doi.org
Evaluation of 3C-SiC/Si residual stress and curvatures along different wafer direction
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Stefania Privitera,
Ruggero Anzalone,
Nicolò Piluso,
Patrick Fiorenza,
Alessandra Alberti,
Giovanna Pellegrino,
Antonino La Magna,
Francesco La Via ,
Carmelo Vecchio,
Marco Mauceri,
Grazia Litrico,
Antonio Pecora,
Danilo Crippa,
Others
Effects of the Growth Rate on the Quality of 4H Silicon Carbide Films for MOSFET Applications
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