Frances Ross
0000-0003-0838-9770
IBM Research
69 papers found
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Silicon Surface Morphology and the Reaction of Silicon with Oxygen
The Etching of Silicon by Oxygen Observed by in situ Tem
High Energy Transmission Electron Diffraction From Surface Monolayers During Silicon Oxidation
The Use of Fresnel Contrast to Study the Initial Stages of The in situ Oxidation of Silicon
Analysis of composition changes across the Si/SiOx interface using fresnel fringe contrast analysis
Quantifying Electrochemical Processes Using Liquid Cell TEM
Resolution in Liquid Cell Experiments
Past, Present, and Future Electron Microscopy of Liquid Specimens
In Situ Transmission Electron Microscopy
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