Feliciano Giustino
0000-0001-9293-1176
89 papers found
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Theory of atomic-scale dielectric permittivity at insulator interfaces
Equivalent oxide thickness of a thin oxide interlayer in gate insulator stacks on silicon
Electronic Structure at Realistic Si(100)-SiO2Interfaces
Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides
Dielectric discontinuity at interfaces in the atomic-scale limit: permittivity of ultrathin oxide films on silicon.
Atomic-scale investigation of the dielectric screening at the interface between silicon and its oxide
Model for high-temperature radiation effects in n-p-n bipolar-junction transistors
Modeling of Si 2p core-level shifts at Si-(ZrO(2))(x)(SiO(2))(1-x) interfaces
Dose and dose-rate effects on NPN bipolar junction transistors irradiated at high temperature
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