Brahim Benbakhti
0000-0001-7209-1333
3 papers found
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Investigation of Preexisting and Generated Defects in Nonfilamentary a-Si/TiO2 RRAM and Their Impacts on RTN Amplitude Distribution
Device and Circuit Performance of the Future Hybrid III–V and Ge-Based CMOS Technology
A Comparative Study of Defect Energy Distribution and Its Impact on Degradation Kinetics in GeO2/Ge and SiON/Si pMOSFETs
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