Dissemin is shutting down on January 1st, 2025

Published in

Handbook of GaN Semiconductor Materials and Devices, p. 367-430, 2017

DOI: 10.1201/9781315152011-12

Handbook of GaN Semiconductor Materials and Devices, p. 367-430

DOI: 10.1201/9781315152011-16

Links

Tools

Export citation

Search in Google Scholar

Reliability in III-Nitride Devices

Book chapter published in 2017 by Davide Bisi, Isabella Rossetto, Jun Hyuk Park, Jong Won Lee, Matteo Meneghini ORCID, Dong Yeong Kim, Enrico Zanoni, Gaudenzio Meneghesso, Jong Kyu Kim
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Full text: Unavailable

Question mark in circle
Preprint: policy unknown
Upload
Question mark in circle
Postprint: policy unknown
Upload
Question mark in circle
Published version: policy unknown
Upload