Published in
IOP Publishing, Journal of Physics: Conference Series, (902), p. 012013, 2017
DOI: 10.1088/1742-6596/902/1/012013
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StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images
Journal article published in 2017 by
A. De Backer 
,
K. H. W. van den Bos,
W. Van den Broek,
J. Sijbers,
S. Van Aert
,
K. H. W. van den Bos,
W. Van den Broek,
J. Sijbers,
S. Van Aert
This paper is made freely available by the publisher.
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