Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 11(64), p. 4372-4373, 2017
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Journal article published in 2017 by
Giovanni Ghione 
,
Yogesh Singh Chauhan,
Karol Kalna,
Giovanni Verzellesi,
Runsheng Wang
,
Yogesh Singh Chauhan,
Karol Kalna,
Giovanni Verzellesi,
Runsheng Wang
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