Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 10(64), p. 4252-4259, 2017
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Leakage Current and Low-Frequency Noise Analysis and Reduction in a Suspended SOI Lateral p-i-n Diode
Journal article published in 2017 by
Guoli Li 
,
Valeriya Kilchytska,
Nicolas Andre,
Laurent A. Francis,
Yun Zeng,
Denis Flandre
,
Valeriya Kilchytska,
Nicolas Andre,
Laurent A. Francis,
Yun Zeng,
Denis Flandre
This paper was not found in any repository, but could be made available legally by the author.
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