Published in
Institute of Electrical and Electronics Engineers, IEEE Journal of Photovoltaics, 6(7), p. 1693-1700, 2017
DOI: 10.1109/jphotov.2017.2736784
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Determination of Dopant Density Profiles of Heavily Boron-Doped Silicon From Low Temperature Microphotoluminescence Spectroscopy
Journal article published in 2017 by
Young-Joon Han 
,
Evan Franklin,
Daniel Macdonald,
Hieu T. Nguyen ,
Di Yan
,
Evan Franklin,
Daniel Macdonald,
Hieu T. Nguyen ,
Di Yan
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