Published in
2017 15th IEEE International New Circuits and Systems Conference (NEWCAS)
DOI: 10.1109/newcas.2017.8010180
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A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor
Proceedings article published in 2017 by
Swaraj Mahato,
J. De Ridder,
Guy Meynants,
Gert Raskin 
,
H. Van Winckel
,
H. Van Winckel
