Published in
2017 75th Annual Device Research Conference (DRC)
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Radiation hardness of Ga<inf>2</inf>O<inf>3</inf> MOSFETs against gamma-ray irradiation
Proceedings article published in 2017 by
Man Hoi Wong,
Akinori Takeyama,
Takahiro Makino,
Takeshi Ohshima,
Kohei Sasaki,
Akito Kuramata,
Shigenobu Yamakoshi,
Masataka Higashiwaki 
