Published in
MDPI, Proceedings of the Royal Society of Victoria, 4(1), p. 375
DOI: 10.3390/proceedings1040375
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Nanomechanical Traceable Metrology of Vertically Aligned Silicon and Germanium Nanowires by Nanoindentation
Journal article published in 2017 by
Gerry Hamdana 
,
Tony Granz,
Maik Bertke ,
Zhi Li,
Prabowo Puranto,
Uwe Brand,
Hutomo Suryo Wasisto ,
Erwin Peiner
,
Tony Granz,
Maik Bertke ,
Zhi Li,
Prabowo Puranto,
Uwe Brand,
Hutomo Suryo Wasisto ,
Erwin Peiner
This paper is made freely available by the publisher.
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