Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 9(64), p. 3576-3581, 2017
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Compact Modeling Source-to-Drain Tunneling in Sub-10-nm GAA FinFET With Industry Standard Model
Journal article published in 2017 by
Yen-Kai Lin 
,
Juan Pablo Duarte,
Pragya Kushwaha,
Harshit Agarwal,
Huan-Lin Chang ,
Angada Sachid ,
Sayeef Salahuddin,
Chenming Hu
,
Juan Pablo Duarte,
Pragya Kushwaha,
Harshit Agarwal,
Huan-Lin Chang ,
Angada Sachid ,
Sayeef Salahuddin,
Chenming Hu
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