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2017 22nd IEEE European Test Symposium (ETS)

DOI: 10.1109/ets.2017.7968245

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A built-in self-test scheme for classifying refresh periods of DRAMs

Proceedings article published in 2017 by Chia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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