Abstract Chemical vapor deposition (CVD)-grown single-layer graphene samples, transferred onto a transmission electron microscope (TEM) grid and onto a quartz plate, were studied using polarized Raman spectroscopy with differing angles of laser incidence ( θ ). Two different polarization configurations are used. In an in-plane configuration , the polarization direction of both incident and scattered light is parallel to the graphene plane. In an out-of-plane configuration , the angle between the polarization vector and the graphene plane is the same as the angle of laser incidence ( θ ). The normalized Raman intensity of the G-band measured in the out-of-plane configuration , with respect to that in the in-plane configuration , was analyzed as a function of θ . The normalized Raman intensity showed approximately cos 2 θ -dependence up to θ  = 70°, which can be explained by the fact that only the electric field component of the incident and the scattered photon in the out-of-plane configuration projected onto the graphene plane can contribute to the Raman scattering process because of the perfect confinement of the electrons to the graphene plane.