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2017 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)

DOI: 10.1109/iccdcs.2017.7959720

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Assessing the accuracy of the open, short and open-short de-embedding methods for on-chip transmission line S-parameters measurements

Proceedings article published in 2017 by Juan-C. Garcia Santos, Reydezel Torres-Torres ORCID
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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