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Conference on Lasers and Electro-Optics

DOI: 10.1364/cleo_at.2017.ath3c.5

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Valley-dependent Carrier and Lattice Dynamics in Silicon measured by Transient XUV Spectroscopy

Proceedings article published in 2017 by Scott K. Cushing, Lucas M. Carneiro, Michael Zürch, Peter M. Kraus ORCID, Chris J. Kaplan, Hung-Tzu Chang, Stephen R. Leone
This paper is available in a repository.
This paper is available in a repository.

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