Published in
American Institute of Physics, Applied Physics Letters, 18(112), p. 182904
DOI: 10.1063/1.5025424
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A current transient method for trap analysis in BiFeO3 thin films
Journal article published in 2018 by
Hui Zhu,
Ying Yang,
Xiao Meng,
Anquan Jiang,
Zilong Bai,
Xiang Zheng 
,
Lei Jin,
Chen Wang,
Shiwei Feng
,
Lei Jin,
Chen Wang,
Shiwei Feng
This paper was not found in any repository, but could be made available legally by the author.
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