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American Institute of Physics, Applied Physics Letters, 7(89), p. 072504

DOI: 10.1063/1.2336742

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Magnetization depth dependence in exchange biased thin films

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This paper is available in a repository.

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Abstract

The depth dependence of the magnetization has been studied in antiferromagnet/ferromagnet (AF/FM) exchange coupled systems. Results from vector magnetometry and magneto-optical Kerr effect probing both the AF/FM and FM/air interfaces demonstrate the existence of a magnetization depth profile in FeF2/FM (FM=Fe, Ni, and Py) bilayers, contrary to the assumptions of most exchange bias models. The appearance of asymmetrical hysteresis loops below the AF Néel temperature (TN) is explained by the creation of spring-like walls parallel to the AF/FM interface and the existence of incomplete domain walls. Changes in the reversal mechanism above TN have also been discussed.