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Institute of Electrical and Electronics Engineers, IEEE Access, (6), p. 16464-16473, 2018

DOI: 10.1109/access.2018.2816959

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Decreasing the System Testing Makespan in a Computer Manufacturing Company

Journal article published in 2018 by Shih-Wei Lin ORCID, Chien-Yi Huang, Kuo-Ching Ying ORCID, Dar-Lun Chen
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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