Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 5(65), p. 1765-1770, 2018
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Reliability Improvements in AlGaN/GaN Schottky Barrier Diodes With a Gated Edge Termination
Journal article published in 2018 by
Eliana Acurio 
,
Felice Crupi ,
Nicolo Ronchi,
Brice De Jaeger,
Benoit Bakeroot ,
Stefaan Decoutere ,
Lionel Trojman
,
Felice Crupi ,
Nicolo Ronchi,
Brice De Jaeger,
Benoit Bakeroot ,
Stefaan Decoutere ,
Lionel Trojman
This paper was not found in any repository, but could be made available legally by the author.
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