Published in
American Institute of Physics, Review of Scientific Instruments, 4(89), p. 043106
DOI: 10.1063/1.5026440
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Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
Journal article published in 2018 by
Takato Inoue,
Satoshi Matsuyama,
Shogo Kawai,
Hirokatsu Yumoto,
Yuichi Inubushi,
Taito Osaka,
Ichiro Inoue 
,
Takahisa Koyama ,
Kensuke Tono,
Haruhiko Ohashi,
Makina Yabashi ,
Tetsuya Ishikawa ,
Others,
Kazuto Yamauchi
,
Takahisa Koyama ,
Kensuke Tono,
Haruhiko Ohashi,
Makina Yabashi ,
Tetsuya Ishikawa ,
Others,
Kazuto Yamauchi
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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