Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 6(38), p. 818-821, 2017
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Experimental Investigation of ${C}$ – ${V}$ Characteristics of Si Tunnel FETs
Journal article published in 2017 by
Chang Liu 
,
Stefan Glass,
Gia Vinh Luong ,
Keyvan Narimani,
Qinghua Han,
Andreas T. Tiedemann,
Alfred Fox,
Wenjie Yu,
Xi Wang,
Siegfried Mantl,
Qing-Tai Zhao
,
Stefan Glass,
Gia Vinh Luong ,
Keyvan Narimani,
Qinghua Han,
Andreas T. Tiedemann,
Alfred Fox,
Wenjie Yu,
Xi Wang,
Siegfried Mantl,
Qing-Tai Zhao
This paper was not found in any repository, but could be made available legally by the author.
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