Published in
American Physical Society, Physical review B, 9(95)
DOI: 10.1103/physrevb.95.094430
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Three-dimensional characterization of Co/Pd multilayer thin films using resonant soft x-ray scattering
Journal article published in 2017 by
Samuel Flewett,
Durgamadhab Mishra,
Thiago J. A. Mori,
Christian M. Günther,
Juliano C. Denardin 
,
Simón Oyarzún,
Sebastián Michea,
Dieter Engel,
Manuel Fohler,
Tulio C. R. Rocha,
Alexandra Ovalle F.,
Leandro T. Núñez A.,
Bastian Pfau,
Juan Escrig,
Stefan Eisebitt
,
Simón Oyarzún,
Sebastián Michea,
Dieter Engel,
Manuel Fohler,
Tulio C. R. Rocha,
Alexandra Ovalle F.,
Leandro T. Núñez A.,
Bastian Pfau,
Juan Escrig,
Stefan Eisebitt
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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