Published in
IOP Publishing, Japanese Journal of Applied Physics, 4S(56), p. 04CA04, 2017
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Bias temperature instability in tunnel field-effect transistors
Journal article published in 2017 by
Wataru Mizubayashi,
Takahiro Mori,
Koichi Fukuda 
,
Yuki Ishikawa,
Yukinori Morita,
Shinji Migita,
Hiroyuki Ota,
Yongxun Liu,
Shinichi O’uchi,
Junichi Tsukada,
Hiromi Yamauchi,
Takashi Matsukawa,
Meishoku Masahara,
Kazuhiko Endo
,
Yuki Ishikawa,
Yukinori Morita,
Shinji Migita,
Hiroyuki Ota,
Yongxun Liu,
Shinichi O’uchi,
Junichi Tsukada,
Hiromi Yamauchi,
Takashi Matsukawa,
Meishoku Masahara,
Kazuhiko Endo
This paper is made freely available by the publisher.
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