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American Institute of Physics, Journal of Vacuum Science and Technology B, 6(30), p. 06FF05

DOI: 10.1116/1.4756947

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Process considerations for layer-by-layer 3D patterning of silicon, using ion implantation, silicon deposition, and selective silicon etching

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This paper is available in a repository.

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Abstract

The authors study suitable process parameters, and the resulting pattern formation, in additive layer-by-layer fabrication of arbitrarily shaped three-dimensional (3D) silicon (Si) micro-and nanostructures. The layer-by-layer fabrication process investigated is based on alternating steps of chemical vapor deposition of Si and local implantation of gallium ions by focused ion beam writing. In a final step, the defined 3D structures are formed by etching the Si in potassium hydroxide, where the ion implantation provides the etching selectivity. V C 2012 American Vacuum Society. [http://dx.doi.org/10.1116/1.4756947]