Published in
Springer Verlag, Journal of Materials Science, 3(52), p. 1647-1660
DOI: 10.1007/s10853-016-0458-7
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Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films
Journal article published in 2016 by
Wolfgang Gruber,
Carsten Baehtz,
Thomas Geue,
Jochen Stahn,
Harald Schmidt
This paper was not found in any repository, but could be made available legally by the author.
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