A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors
Journal article published in 2018 by
Weifeng Chen,
Weijing Wu,
Lei Zhou,
Miao Xu,
Lei Wang,
Honglong Ning 
,
Junbiao Peng
,
Junbiao Peng
This paper is made freely available by the publisher.
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