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Advances in Metrology for X-Ray and EUV Optics VI

DOI: 10.1117/12.2237599

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Ray-tracing as a tool for efficient specification of beamline optical components

Proceedings article published in 2016 by P. Pedreira ORCID, I. Sics, M. Llonch, J. Ladrera, L.-L. Ribó, C. Colldelram, J. Nicolas ORCID
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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